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- A focused transducer is employed for photoacoustic depth profiling of port wine stain(PWS) skin. 本文提出了一種基于聚焦換能器的光聲深度分辨技術(shù)來(lái)實(shí)現對PWS皮膚的評估。
- For an accurate depth profiling of the Ge concentration, detailed knowledge of the dependence of the refractive index of the SiGe alloy as a function of the Ge concentration is required. 對于一個(gè)準確的鍺濃度縱向分布來(lái)說(shuō)，需要有鍺硅合金的反射率關(guān)系以作為鍺濃度的函數的詳細知識。
- Microhardness, depth profile and wear mechanisms were investigated by means of MVK H12, TALYSURF6, XPS and microscopy. 采用顯微硬度、輪廓深度、XPS、顯微鏡觀(guān)察等研究磨損機理。
- A non-destructive remote technique for obtaining depth profile of laser processed metals by laser- induced IR photothermal radiometry is reported. 介紹了一種用激光誘發(fā)紅外光熱輻射法對金屬材料激光表面硬化層進(jìn)行深度剖析的新技術(shù)。
- The layers of steel 45 RE-boron-Aluminized were observed by SEM,and the surface scanning of Al,Ce and the depth profiles of B,C,Al,Fe were analyzed. 通過(guò)掃描電鏡觀(guān)察了45鋼稀土硼鋁共滲的滲層形貌，并進(jìn)行了鋁和鈰的面掃描分以及硼、碳、鋁、鐵的線(xiàn)掃描分析。
- Depth profiling of hydrogen and deuterium in films by ERDA 采用彈性反沖分析法同時(shí)測量薄膜中氫和氘的深度分布
- The layers of steel45 RE-boron-Aluminized were observed by SEM, and the surface scanning of Al, Ce and the depth profiles of B, C, Al, Fe were analyzed. 通過(guò)掃描電鏡觀(guān)察了45鋼稀土硼鋁共滲的滲層形貌，并進(jìn)行了鋁和鈰的面掃描分以及硼、、、的線(xiàn)掃描分析。
- The X ray Photoelectron Spectroscopy (XPS) has been used for the element qualitation,quantitation,chemical state analysis and depth profile of InGaAsP/InP MOCVD film. 采用X射線(xiàn)光電子能譜（XPS）對InGaAsP/InP異質(zhì)結構MOCVD外延晶片作了表面薄層元素、組分定性、定量和深度分布分析。
- Especially,to heterogeneity serious conglomerate reservoir,the control of injection pressure is more important.On the basis of the design of depth profile control paramete... 特別是對于非均質(zhì)性嚴重的礫巖油藏來(lái)說(shuō) ,注入壓力的控制顯得更為重要。
- Test Method for Water Content of Soil and Rock In-Place by the Neutron Depth Probe Method 用中子深探針?lè )▽Φ乇硗寥篮蛶r石中含水量的試驗方法
- This creature lives in the depth of the ocean. 這種生物生活在海洋深處。
- Surface chemical analysis - Depth profiling - Measurement of sputtered depth 表面化學(xué)分析。深度剖面。濺涂深度的測量
- In the procedure used in the paper a reliable depth profile of nitrogen in TiN_x/ TiSi_x bilayer structure can be obtained, The results on interaction of Ti/Si and Ti/SiO_2/Si during RTA in N_2 and Ar ambient have also been presented. 本文采用窄能量窗口選擇和譜圖疊減處理法精確的分析了TiN_X/TiSi_X雙層結構中N的深度分布,同時(shí)給出了有關(guān)Ti/Si,Ti/SoO_2/Si在快速熱退火后界面反應和產(chǎn)物的結果。
- Discharge conditions at which depth profile analysis of tinplate had good depth resolution were selected by researching spectrometric behaviors of tinplate at different discharge conditions. 摘要通過(guò)研究不同放電條件下鍍錫鋼板的光譜行為，確定了具有較好深度分辨率的放電條件，建立了鍍錫鋼板的輝光放電發(fā)射光譜定量深度分析方法。
- By using sputtering rate correction, linear calibration curve of mutil matrixes was established and the quantitative depth profile analysis of the coating of the colored steel strips was reached. 通過(guò)濺射率校正，建立了多基體的線(xiàn)性校準曲線(xiàn)，解決了彩涂鋼板涂鍍層的逐層定量分析。
- I was out of my depth in that class. 在那個(gè)班里我跟不上。
- Photoacoustic phase shows the special ability of measuring the optical and thermal properties, studying the nonradiative relaxation processes and analyzing the depth profile of the sample and so on. 光聲位相在測定樣品的光學(xué)和熱學(xué)性質(zhì)、樣品無(wú)輻射弛豫過(guò)程的研究以及深度剖面分析等方面顯示了特有的能力。
- A proton or a neutron, especially as part of an atomic nucleus. 核子質(zhì)子或中心，尤指作為原子核的一個(gè)組成部分
- A Si/Mo noncrystalline multilayer film sample was cut into two equal pieces in surface area for two times SIMS depth profile analysis by using RAS POINT MODE and POINT MODE respectively. 本文主要介紹了輝光放電光譜儀的分析原理、分析特點(diǎn)以及在鋼鐵分析中的兩個(gè)主要應用 :基板分析和深度剖面分析。
- Reduction of Ceria (CeO_2) Induced by Argon Ion Beam in XPS Depth Profiling XPS深度剖析中氬離子誘發(fā)氧化鈰(CeO_2)還原反應
