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- The crystals were cleaned by argon ion bombardment. 結晶體由氬離子轟擊而凈化。
- The crystals were cleaned by argon ion bombardment . 結晶體由氬離子轟擊而凈化。
- Ion bombardment promotes interfacial diffusion and enhances interface adhesion. 也可借助離子的轟擊作用形成結合良好的擴散過(guò)渡層；
- ion bombardment secondary electron image 離子轟擊二次電子像
- Abstract Secondary Ion Mass Spectrometry (SIMS) is a new analytical techniquefor labile, nonvolatile organic compounds. 摘要 二次離子質(zhì)譜法(SIMS)是一種分析易熱解和不揮發(fā)的有機化合物的新技術(shù)。
- Abstract Secondary ion mass spectrometry(SIMS) is more sensitive than other surface microregion analysis instrumentals. 摘要 二次離子質(zhì)譜 ( SIMS)比其他表面微區分析方法更靈敏。
- On the basis of the study of the fine structure of the ion-nitrided layer, this paper discussed the mechanism of accelerating process of ionnitriding by ion bombardment. 在對離子滲氮層的精細結構進(jìn)行了較深入研究的基礎上,對離子轟擊加速滲氮的機理進(jìn)行了探討。
- Fast Atom Bombardment and Secondary Ion Mass Spectrometry 快原子轟擊電離和二次離子質(zhì)譜
- Time-of-Flight secondary ion mass spectrometry (TOF-SIMS) is a very sensitive surface analytical technique, well established for many industrial and research applications. 飛行時(shí)間二次離子質(zhì)譜(TOF-SIMS)是一種非常靈敏的表面檢測技術(shù)。
- The experiments were performed by means of Secondary Ion Mass Spectroscopy (SIMS) and Auger Electron Spectroscopy (AES). 采用了二次離子質(zhì)譜儀(SIMS)和俄歇電子譜儀(AES)進(jìn)行表面分析。
- The Secondary Ion Mass Spectrometer (SIMS). especially dynamic SIMS. is the most suitable instrument for particle isotopic analysis. 動(dòng)態(tài)型二次離子質(zhì)譜(SIMS)是進(jìn)行微粒同位素分析最適用的測量?jì)x器之一。
- Isotope ratios of Pb contained in wares were measured using Time-Of-Flight Secondary Ion Mass Spectrometry(TOF-SIMS)without any references. 介紹了用飛行時(shí)間二次離子質(zhì)譜法對器物中的鉛同位素比值的測量。
- The results of SEM, ESCA and FTP - IR - ATR analysis indicated that C - H and C - O bonds on the surface were broken up and the degree of phase separation was increased after Si ion bombardment. 同時(shí)用掃描電子顯微鏡、電子能譜化學(xué)分析和傅里葉變換紅外譜對材料的分析表明:注入的Si~+打斷了材料表面的一些基團,而且使材料表面變得粗化。
- In this paper the formation of molecule-ion clusters in the liquid secondary ion mass spectrometric analysis of phospholipids DMPG, DMPC and DMPE has been studied systematically. 對3種極性頭不同的磷脂DMPG、DMPC、DMPE的液相二次離子質(zhì)譜分析中出現的分子離子簇現象進(jìn)行了系統的研究。
- Th has been produced via a multinucleon transfer reaction by 60MeV/u 18 O ions bombardment of natural uranium. 利用 6 0MeV/u的18O離子束轟擊天然鈾靶 ,通過(guò)多核子轉移反應生成重豐中子核素2 37Th ,由多步快速放射化學(xué)分離方法從被照射過(guò)的靶物質(zhì)中分離出釷元素。
- A time-of-flight secondary ion mass spectrometer(TOF-SIMS),X-ray photoelectron spectroscopy(XPS),an atomic force microscopy(AFM),and contact angle measurements were used to characterize the monolayer. 使用時(shí)間飛行二次離子質(zhì)譜儀(TOF-S IM S)、X射線(xiàn)光電子能譜儀(XPS)、原子力顯微鏡(AFM)和接觸角測量?jì)x對FTE自組裝膜進(jìn)行了表征。
- Keywords double cathodes;ion bombardment; 雙陰極;離子轟擊;
- The enhanced adhesion of Cu films on Si substrates under MeV Cl ion beam irradiation was studied through analysis of Scanning Auger Microprobe (SAM) and Secondary Ion Mass Spectroscopy(SIMS). 本文通過(guò)用掃描俄歇微探針（SAM）和二次離子質(zhì)譜（SIMS）分析了高能氯離子注 入Cu/Si系統，對Cu薄膜附著(zhù)力增強效應進(jìn)行了研究。
- To study diffusion behaviors, secondary ion mass spectrometer (SIMS) along with the Boltzmann-Matano inverse method is used to derive concentration-dependent diffusivity of H+ in Z-cut LiNbO3. 在擴散模型方面，以二次離子質(zhì)譜儀縱深分析，搭配數值方法反推出氫離子于鈮酸鋰晶體中的濃度相依擴散率。
- The instrument directs the secondary ions to a mass spectrometer that identifies their compositions. 儀器會(huì )將次級離子導向質(zhì)譜儀，以?定其組成。
