The enhanced adhesion of Cu films on Si substrates under MeV Cl ion beam irradiation was studied through analysis of Scanning Auger Microprobe (SAM) and Secondary Ion Mass Spectroscopy(SIMS).是什么意思_The enhanced adhesion of Cu films on Si substrates under MeV Cl ion beam irradiation was studied through analysis of Scanning Auger Microprobe (SAM) and Secondary Ion Mass Spectroscopy(SIMS).在線(xiàn)翻譯_英語(yǔ)_讀音_用法_例句