The results of SEM, ESCA and FTP - IR - ATR analysis indicated that C - H and C - O bonds on the surface were broken up and the degree of phase separation was increased after Si ion bombardment.

 
  • 同時(shí)用掃描電子顯微鏡、電子能譜化學(xué)分析和傅里葉變換紅外譜對材料的分析表明:注入的Si~+打斷了材料表面的一些基團,而且使材料表面變得粗化。
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