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- Abstract Secondary Ion Mass Spectrometry (SIMS) is a new analytical techniquefor labile, nonvolatile organic compounds. 摘要 二次離子質(zhì)譜法(SIMS)是一種分析易熱解和不揮發(fā)的有機化合物的新技術(shù)。
- Abstract Secondary ion mass spectrometry(SIMS) is more sensitive than other surface microregion analysis instrumentals. 摘要 二次離子質(zhì)譜 ( SIMS)比其他表面微區分析方法更靈敏。
- Abstract A modified ion optic system has been developed and used to a orthoranal glow discharge time of flight mass spectrometer (GD -TOFMS). 摘要 本文介紹一種經(jīng)過(guò)改進(jìn)的離子光學(xué)系統，并用于垂直引出式輝光放電飛行時(shí)間質(zhì)譜儀。
- Time-of-Flight secondary ion mass spectrometry (TOF-SIMS) is a very sensitive surface analytical technique, well established for many industrial and research applications. 飛行時(shí)間二次離子質(zhì)譜(TOF-SIMS)是一種非常靈敏的表面檢測技術(shù)。
- The experiments were performed by means of Secondary Ion Mass Spectroscopy (SIMS) and Auger Electron Spectroscopy (AES). 采用了二次離子質(zhì)譜儀(SIMS)和俄歇電子譜儀(AES)進(jìn)行表面分析。
- The Secondary Ion Mass Spectrometer (SIMS). especially dynamic SIMS. is the most suitable instrument for particle isotopic analysis. 動(dòng)態(tài)型二次離子質(zhì)譜(SIMS)是進(jìn)行微粒同位素分析最適用的測量?jì)x器之一。
- Isotope ratios of Pb contained in wares were measured using Time-Of-Flight Secondary Ion Mass Spectrometry(TOF-SIMS)without any references. 介紹了用飛行時(shí)間二次離子質(zhì)譜法對器物中的鉛同位素比值的測量。
- In this paper the formation of molecule-ion clusters in the liquid secondary ion mass spectrometric analysis of phospholipids DMPG, DMPC and DMPE has been studied systematically. 對3種極性頭不同的磷脂DMPG、DMPC、DMPE的液相二次離子質(zhì)譜分析中出現的分子離子簇現象進(jìn)行了系統的研究。
- A time-of-flight secondary ion mass spectrometer(TOF-SIMS),X-ray photoelectron spectroscopy(XPS),an atomic force microscopy(AFM),and contact angle measurements were used to characterize the monolayer. 使用時(shí)間飛行二次離子質(zhì)譜儀(TOF-S IM S)、X射線(xiàn)光電子能譜儀(XPS)、原子力顯微鏡(AFM)和接觸角測量?jì)x對FTE自組裝膜進(jìn)行了表征。
- The enhanced adhesion of Cu films on Si substrates under MeV Cl ion beam irradiation was studied through analysis of Scanning Auger Microprobe (SAM) and Secondary Ion Mass Spectroscopy(SIMS). 本文通過(guò)用掃描俄歇微探針（SAM）和二次離子質(zhì)譜（SIMS）分析了高能氯離子注 入Cu/Si系統，對Cu薄膜附著(zhù)力增強效應進(jìn)行了研究。
- To study diffusion behaviors, secondary ion mass spectrometer (SIMS) along with the Boltzmann-Matano inverse method is used to derive concentration-dependent diffusivity of H+ in Z-cut LiNbO3. 在擴散模型方面，以二次離子質(zhì)譜儀縱深分析，搭配數值方法反推出氫離子于鈮酸鋰晶體中的濃度相依擴散率。
- The instrument directs the secondary ions to a mass spectrometer that identifies their compositions. 儀器會(huì )將次級離子導向質(zhì)譜儀，以?定其組成。
- Fifth Seminar on Problems of Theoretical and Applied Electron and Ion Optics 理論與應用電子和離子光學(xué)的問(wèn)題
- secondary ion mass spectrometry, SIMS 次級離子質(zhì)譜
- ION OPTICS DESGIN OF A 200 kV NONLINEAR HIGH CURRENT ACCELERATION TUBES 200 kV非線(xiàn)性強流加速管的離子光學(xué)設計
- secondary ion mass spectrometer (SIMS) 二次離子質(zhì)譜儀
- Latest Progress in Secondary Ion Mass Spectroscopy 二次離子質(zhì)譜學(xué)的新進(jìn)展
- secondary ion emission microanalyzer 二次離子發(fā)射顯微分析儀
- secondary ion mass spectroanalyzer 二次離子質(zhì)譜分析器
- secondary ion mass spectrometry (SIMS) 次級離子質(zhì)譜
