您要查找的是不是:
- In this thesis, Scanning Force Microscopy (SFM) was used to study the nanoscale electric phenomena of the surface and interface properties of ferroelectric thin films. 本論文利用掃描力顯微鏡研究了鐵電薄膜表面與界面的電勢及電疇等微區性質。
- Study on nano-meter scale observation of latent tracks induced by ions are discussed using scanning tunneling microscopy(STM) and scanning force microscopy(SFM). 綜述了近年來用掃描隧道顯微鏡(STM)和掃描力顯微鏡(SFM)在原子水平上觀測輻射損傷潛徑跡的研究及進展。
- Abstract Study on nano-meter scale observation of latent tracks induced by ions are discussed using scanning tunneling microscopy(STM) and scanning force microscopy(SFM). 摘要 綜述了近年來用掃描隧道顯微鏡 (STM )和掃描力顯微鏡 (SFM)在原子水平上觀測輻射損傷潛徑跡的研究及進展。
- MEASURMENT OF SURFACE ELECTROSTATIC POTANTIAL USING SCANNING FORCE MICROSCOPY 利用掃描力顯微鏡測量表面靜電勢
- Glass-to-rubber transition of polymer film analyzed by scanning force microscopy 掃描力顯微術在高聚物薄膜玻璃化轉變研究中的應用
- Keywords scanning force microscopy(SFM);froce modulation microscopy(FMM);elasticity;border; 掃描力顯微術;力調制顯微術;彈性;邊界;
- We had developed a model based on the equations related to the principle of scanning electric force microscopy (EFM). 在本論文中,經由掃描式電場力顯微術(EFM)的原理,我們發展出一個模型。
- By using scanning polarization force microscopy (SPFM),it is possible to observe in situ the deliquescence process of salt in air. 潮解是一個經典的物化現象,由于缺乏直接的顯微手段,對潮解的微觀動態過程,一直沒有細致的了解。
- Together with Rohrer, we started brainstorming ways to apply STM or other scanning probe techniques, specifically atomic force microscopy (AFM), to the world beyond science. 我們與羅瑞爾一起開始鉆研如何將STM或其他掃描探針技術,特別是原子力顯微鏡(AFM),應用到純科學以外的世界。
- Auger electron spectroscopy (AES), scanning electron microscopy (SEM) and atomic force microscopy (AFM) are used to analyze component and surface morphology of the films. 用俄歇電子能譜(AES)、掃描電鏡(SEM)和原子力顯微鏡(AFM)對薄膜的組成成分和表面形貌進行了分析。
- The structures of RDX/RF aerogel were characterized by atomic force microscopy(AFM),scanning electron microscopy(SEM),X-ray powder diffraction(XRD),and BET method. 用原子力顯微鏡(AFM),掃描電子顯微鏡(SEM),X射線粉末衍射儀(XRD),BET比表面積分析儀對其結構進行了表征。
- Trypan blue dye, Atomic Force Microscopy scan and enzyme activity observation was used to evaluate toxicity of Gluthion. 采用臺盼藍活細胞拒染、原子力顯微鏡(AFM)及細胞內酯酶活性判定方法評價NAC毒性。
- This course introduces the principles and application of scanning probe microscopy (SPM), including atomic force microscopy (AFM) and scanning tunneling microscopy (STM). 本課程介紹掃瞄探針顯微術(SPM,包括原子力顯微術AFM及掃瞄隧穿顯微術STM)之原理及應用。
- The surface morphology are studied using atomic force microscopy (AFM). 表面形貌用原子力顯微鏡(AFM)進行分析。
- For the former, biological imaging study of atomic force microscopy (AFM), atomic force/photon scanning tunneling microscope (AF/PSTM) operating, and biological imaging of AF/PSTM are elucidated. 對于前者,闡述了原子力顯微鏡(AFM)對生物樣品的成像研究,原子力與光子掃描隧道組合顯微鏡(AF/PSTM)的實驗操作及其對各種樣品的成像,特別是生物樣品的成像。
- X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM) and reflection high energy diffraction (RHEED) were used to characterize the structures and the morphologies of the samples. 利用X射線衍射(XRD)、掃描電子顯微術(SEM)、原子力顯微術(AFM)、反射式高能電子衍射(RHEED)等手段測試,對樣品結構和表面形貌進行表征。
- Objective To observe the surface structure of amelanotic melanocytes( AMMCs) from human hair follicles by atomic force microscopy( AFM). 目的用原子力顯微鏡觀察人頭發毛囊內無色素黑素細胞的表面結構。
- The piezoresponse force microscopy(PFM) is a useful method to study ferroelectric domains of ferroelectric films. 壓電響應力顯微鏡為鐵電薄膜電疇的研究提供了一種有效的檢測方法。
- Magnetic domains of the TbFe films with different deposition angles were studied by magnetic force microscopy. 本研究工作利用MFM研究了不同濺射角度得到的TbFe薄膜的磁疇結構。
- Atomic force microscopy(AFM) has been an important tool for observing and manipulating samples at nanometer scale. 原子力顯微鏡(Atomic Force Microscopy)已成為在納米尺度對樣品進行觀察和操縱的重要工具。