X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM) and reflection high energy diffraction (RHEED) were used to characterize the structures and the morphologies of the samples.
英
美
- 利用X射線(xiàn)衍射(XRD)、掃描電子顯微術(shù)(SEM)、原子力顯微術(shù)(AFM)、反射式高能電子衍射(RHEED)等手段測試,對樣品結構和表面形貌進(jìn)行表征。
