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- Design of a software system under windows for electron probe microanalysis. Windows下電子探針軟件系統的設計
- Quantitative analysis of powdered glass samples by electron probe microanalysis. 用電子探針定量測定玻璃粉末樣品。
- Electron probe microanalysis (EPMA) shows that silicon is only substituted for phosphorus. 電子探針?lè )治鼋Y果表明;硅只取代磷進(jìn)入SAPO-5分子篩骨架.
- A mineralogical investigation of platinum-group metal placers from Burma was made by electron probe microanalysis (EPMA). 采用電子探針?lè )治觯‥PMA），對緬甸鉑族金屬砂礦中的礦物種類(lèi)進(jìn)行了研究。
- The reason of crack defect in gear box body was studied by electron probe microanalysis from the formation process of graphite. 利用電子探針，針對齒輪箱箱體裂紋，從石墨的形成過(guò)程剖析產(chǎn)生這一現象的原因。
- Several kinds of inclusions in GdCOB crystals grown by the Bridgman method are discussed with optical microscopic observations and electron probe microanalysis. 本文通過(guò)對GdCOB晶體進(jìn)行了光學(xué)顯微觀(guān)察 ; 結合電子探針微區分析手段 ,討論了Bridgman法生長(cháng)所得GdCOB晶體中幾類(lèi)不同性質(zhì)的包裹物。
- Microstructure characteristics of repairing welded joint of TA15 Ti alloy were analyzed by optics microscope, X-ray diffraction and electron probe microanalysis. 采用光學(xué)顯微鏡、X射線(xiàn)衍射儀和電子探針等測試手段分析TA15鈦合金熔焊接頭補焊微觀(guān)組織特征,探討鈦合金焊縫多次補焊的可行性。
- Failure causes of double clip reed were analyzed by means of optical microscopy, scanning electron microscopy, electron probe microanalysis and micro hardness tester. 采用光學(xué)金相、描電鏡、子探針成分分析和顯微硬度測定等方法分析了雙卡簧片非正常斷裂的原因。
- Reasons of failure in cooling pipe of the reactor have been studied by the chemical composition analysis,optical microscopy examination and electron probe microanalysis. 應用化學(xué)分析、金相和電子探針顯微分析技術(shù)對反應器中冷卻水管的失效原因進(jìn)行了分析。
- Abstract： Failure causes of double clip reed were analyzed by means of optical microscopy, scanning electron microscopy, electron probe microanalysis and micro hardness tester. 摘 要： 采用光學(xué)金相、掃描電鏡、電子探針成分分析和顯微硬度測定等方法分析了雙卡簧片非正常斷裂的原因。
- The distributions of composition, phase-and microstructure were examined respectively by using electron probe microanalysis (EPMA), X-ray Diffraction (XRD) and scanning electron microscopy (SEM). 分別用電子探針(EPMA)、X衍射(XRD)和掃描電鏡(SEM)查證了其組分、相結構和顯微結構的梯度分布.
- The EPMA(electron probe microanalysis)results showed that the distribution of main components was graded in the five-layer system,which enhanced the interfacial bonding between layers. 電子探針?lè )治鼋Y果顯示 ;五層體系中各組分沿橫截面呈梯度分布 ;有效加強了層間結合 .
- Differential scanning calorimetry(DSC), electron probe microanalysis(EPMA) and rapid solidification were adopted to study the effects of Ni and Mn on the microstructure, solidification process and aging hardening characteristics of Al Si Cu Mg alloy. 采用DSC差熱分析及急冷試驗方法并輔以微區成分分析 ,探討了Ni和Mn對Al Si Cu Mg四元合金凝固組織、凝固過(guò)程及時(shí)效硬化特性的影響。
- Morphologies and elemental compositions of Sm4 (SiO4)3 crystals with splinter-, lath-, branch-, pillar-and needle-shape in the holes of regulus of Sm2O3/ diopside(CaMgSi2O6) were studied with electron probe microanalysis (EPMA) . 利用電子探針顯微分析儀(EPMA)對Sm2O3/透輝石(CaMgSi2O6)復合助燒劑熔塊孔洞中的Sm4(SiO4)3晶體進(jìn)行了形貌和元素分析。
- electron probe microanalysis (EPMA) 電子探針顯微分析,電子探針微區分析
- X-ray electron probe microanalysis X射線(xiàn)電子探針顯微分析
- The physical properties of WO3 thin films were tested by scanning electron microscope X-ray diffraction and electron prober microanalysis measurements respectively. 采用掃描電子顯微鏡、X射線(xiàn)衍射、和電子探針顯微分析技術(shù)測試了WO3薄膜的表面形貌、晶體結構和成分比例等。
- Application of Ion Probe in a Magnetized Discharge Plasma 靜電離子探針在氣體放電磁化等離子體參數測量中的應用
- ION PROBE TECHNOLOGY APPLICATED IN GEOCHEMISTRY RESEARCH 離子探針技術(shù)在地球化學(xué)研究中的應用綜述
- The Phase Transition in Alumina Studied by Eu~(3+) Ion Probe 銪離子探針研究Al_2O_3的相變過(guò)程
