The distributions of composition, phase-and microstructure were examined respectively by using electron probe microanalysis (EPMA), X-ray Diffraction (XRD) and scanning electron microscopy (SEM).

 
  • 分別用電子探針(EPMA)、X衍射(XRD)和掃描電鏡(SEM)查證了其組分、相結構和顯微結構的梯度分布.
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