The physical properties of WO3 thin films were tested by scanning electron microscope X-ray diffraction and electron prober microanalysis measurements respectively.

 
  • 采用掃描電子顯微鏡、X射線(xiàn)衍射、和電子探針顯微分析技術(shù)測試了WO3薄膜的表面形貌、晶體結構和成分比例等。
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