您要查找的是不是：
- Figure 3: The simple white-on-black test pattern used to determine some of the effects of aperture shape on the out-of-focus images. 圖三：一些簡(jiǎn)單的黑白的測試圖樣，用于判定光圈形狀對失焦圖像的影響。
- Abstract：How to generate CPU test pattern efficiently is a big problem to people who write the test program. 摘要：如何科學(xué)有效地生成CPU測試圖形，是困擾測試程序開(kāi)發(fā)人員的一個(gè)難題。
- How to generate CPU test pattern efficiently is a big problem to people who write test programs. 如何科學(xué)有效地生成CPU測試圖形,是困擾測試程序開(kāi)發(fā)人員的一個(gè)難題。
- It does require the addition of some extra control bits padded to the compressed test pattern. 這個(gè)方法需要將一些額外的控制資訊填到被壓縮的測試資料里。
- Please tell using which test pattern of AVIA to adjust the Blacklight of the LCD TV? 不要改動(dòng)三原色吧，用肉眼看很難知道調成怎樣。用普通調對比光暗已可以了。
- An automatic test pattern generation (ATPG) algorithm for deliberately selected delay faults is presented to cope with the crosstalk-induced delay effects on longer paths. 由于電路中較長(cháng)的通路具有較短的松弛時(shí)間，因此容易因為串擾問(wèn)題產(chǎn)生時(shí)延故障。
- Do the same thing by looking at the dark parts of the test pattern, and use the blue bias to adjust until the dark parts of the pattern also look cyan. 對測試圖案的較暗部分做相同步驟的調整。調節藍管的偏置使較暗部分的測試圖案也呈青色。
- THE HOLOLENS AND THE PATTERN DISTORTION CORRECT ION 全息透鏡及其像差校正
- Abstract： The paper proposes controlling input values tracing algorithm and test derivation algorithm based on test pattern generation using satisfiability. 摘 要： 以組合電路的滿(mǎn)足性測試生成算法為基礎，提出了控制輸入跟蹤算法和測試衍生算法。
- Investigates the implementation scheme of cellular automata (CA) for application in the pseudo-random test of very large scale integration (VLSI) as a test pattern generator. 摘要研究細胞自動(dòng)機(CA)在超大規模集成電路(VLSI)偽隨機測試中作為測試激勵的結構和實(shí)現方法。
- Then the above learned information in the conjunctive normal form clauses is used to restrict and focus the overall search space of SAT-based test pattern generation. 之后從該圖中學(xué)習出引起沖突賦值的合取范式子句，將這些學(xué)習的子句增補到子句庫中，用以限制和修剪測試生成的搜索空間，從而加速測試模式的生成過(guò)程。
- A test pattern. 考試模式
- A simple test will show if this is real gold. 簡(jiǎn)單的試驗就能證明這是否是真金。
- A local view scan measuring method is adopted, by 10/0.25 micro objective and 3# resolution test pattern (resolution factor is 1.8751p/mm.) . the average measured value of CTF is 0.52 and simulated result is 0.66. 在檢測過(guò)程中，采用局部視場(chǎng)掃描測量方法，選用10/0.;25的顯微物鏡，3%23鑒別率板(分辨率為1
- The generation of test pattern is one of the critical problems in digital circuit testing. The paper expounds determinate test pattern generation and partial random test pattern generation in the CAT In-circuit Test System-DCTS -CAT. 測試生成是數字電路測試的關(guān)鍵問(wèn)題之一,文章閘述計算機輔助測試系統DCTS-CAT儀中測試圖形產(chǎn)生的確定法和部分隨機法。
- Compared with the traditional mixed mode test, the test power caused by pseudo-random test patterns was decreased. 與傳統的混合測試模式相比，克服了偽隨機測試階段帶來(lái)的功耗問(wèn)題。
- The adder self-test is designed with such operations as left shift, logic AND for the test patterns, and so on. 借助于測試矢量左移、邏輯與操作等方式對加法器自測試進(jìn)行了設計。
- The test chart consists of groups of lines arranged to form USAF standard test patterns. 測試圖由一組按USAF的標準測試圖案排列的線(xiàn)條構成。
- Pupils who pass the test will be promoted to the next higher grade. 小學(xué)生只要考試及格就會(huì )升到高年級。
- He held the test tube in his hand thoughtfully. 他沉思地把試管拿在手里。
