The generation of test pattern is one of the critical problems in digital circuit testing. The paper expounds determinate test pattern generation and partial random test pattern generation in the CAT In-circuit Test System-DCTS -CAT.
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- 測試生成是數字電路測試的關(guān)鍵問(wèn)題之一,文章閘述計算機輔助測試系統DCTS-CAT儀中測試圖形產(chǎn)生的確定法和部分隨機法。
