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- X-射線(xiàn)電子能譜X- ray electron energy spectrum
- 用X-射線(xiàn)電子能譜儀分析TiO_2光學(xué)薄膜X-ray photoelectron spectroscopy of TiO_2 films
- 并由X射線(xiàn)電子能譜(XPS)和紫外吸收光譜(uv)分析證實(shí)。X-ray photoelectron spectroscopic (XPS) analysis and ultraviolet-visible (UV) absorption spectrum results also confirmed this idea.
- Ｘ射線(xiàn)電子能譜學(xué)X-ray electron spectroscopy
- 苯并噻唑衍生物的氣相HeI紫外光電子能譜(UPS)及量子化學(xué)研究Studies on Derivatives of Benzothiazole by HeI Photoelectron Spectroscopy
- 經(jīng)X射線(xiàn)電子能譜 (XPS)和X射線(xiàn)衍射分析 (XRD) ,發(fā)現硬化層中的組織有立方氮化硼 (c BN)、六方氮化硼 (h BN)、B2 O3,FeB和Fe2 B。Cubic boron nitride(c BN), hexagonal boron nitride (h BN), B 2O 3, FeB and Fe 2B were found in the hardened layers by X ray photoelectron spectroscopy(XPS) and X ray diffraction (XRD).
- 用可調探測深度電子能量損失譜與俄歇電子能譜研究Pb/Ni(001)界面TUNABLE-SAMPLING-DEPTH ELECTRON ENERGY LOSS SPECTROSCOPY AND AUGER ELECTRON SPECTROSC-OPY STUDIES OF Pb/Ni(001) INTERFACE
- X射線(xiàn)能譜X ray spectroscopy
- PECVD法低溫形成SiO_xN_y介質(zhì)膜的俄歇電子能譜和紅外吸收光譜分析Analysis of Auger electron spectrum and infrared absorption spectra of the SiO_xN_y thin dielectric film formed by low temperature PECVD
- 電子能譜學(xué)electron spectroscopy
- 用電子能譜(ESCA)和紅外光譜(IR)法對聚合物結構進(jìn)行表征。Structure of polymerized products was characterized by IR spectroscopy and ESCA measurement.
- 電子能譜electron spectrum
- 電子能譜法photoelectron spectrometry
- 雙示蹤元素X射線(xiàn)能譜診斷激光等離子體電子溫度DETERMINATION OF ELECTRON TEMPERATURE IN LASER-PRODUCED PLASMAS BY ISOELECTRONIC X-RAY SPECTROSCOPY
- 電子能譜術(shù)electron spectroscopy
- 俄歇電子能譜儀Auger electron spectrometer
- 掃描電子顯微鏡及X射線(xiàn)能譜儀在物證鑒定中的應用APPLICATION OF SEM AND EDS FOR IDENTIFYING JUDICIAL EVIDENCE
- 電子能譜分析electron spectrum analysis
- 俄歇電子能譜術(shù)Auger electron spectroscopy
- 膜上沙塵粒子的電子顯微鏡照片和它的X射線(xiàn)能譜(沙塵1樣品)Electron micrograph of a dust particle on nitron-barium chloride film and its X-ray spectrum (sample of case 1)
