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- X射線(xiàn)衍射能譜法EDXRD
- 用掃描電鏡(SEM)、能譜(EDS)和X射線(xiàn)衍射(XRD)測試其微觀(guān)結構。The microstructure has been studied using SEM, EDS and XRD.
- 利用金相、掃描電鏡 /能譜及X射線(xiàn)衍射等分析其腐蝕形貌、成分及結構 .The morphology of corrosion products and scale structure were examined with OM,SEM/EDX and XRD.
- 廣角X射線(xiàn)衍射法WAXD
- 掃描電鏡-X射線(xiàn)能譜法SEM-EDXA
- x射線(xiàn)衍射顯微術(shù)x ray diffraction microscopy
- 軟X射線(xiàn)能譜Soft X-ray spectrum
- 高溫X射線(xiàn)衍射high temperature X-ray diffraction
- 粉晶X射線(xiàn)衍射powder X-ray diffraction
- GB/T2679.11-1993紙和紙板中無(wú)機填料和無(wú)機涂料的定性分析電子顯微鏡/X射線(xiàn)能譜法Paper and board--Qualitative analysis of mineral filler and mineral coating--SEM/EDAX method
- 角散X射線(xiàn)衍射ADXRD
- X射線(xiàn)光電子能譜X-ray photoelectron spectroscopy
- 高速鋼中碳化物相的定量分析X射線(xiàn)衍射儀法Carbides in high speed steel; Quantitative phase analysis; Method of X-ray diffractometer
- INCA-X射線(xiàn)能譜儀INCA X-ray energy dispersive spectrometer
- 用Bridgman法合成SnTe晶體,并用X射線(xiàn)衍射儀測試其顯微結構,發(fā)現其晶格常數比標準值略小。SnTe crystals have been grown using Bridgman method, and coefficients of their crystal lattice are measured though X-ray diffraction,which are smaller than the standard value.
- 變角X射線(xiàn)光電子能譜ADXPS
- X射線(xiàn)衍射線(xiàn)形寬化時(shí)點(diǎn)陣參數精確測定的解卷積法PRECISION MEASUREMENT OF CRYSTAL LATTICE PARAMETERS WITH BROADENED X-RAY DIFFRACTION LINE PROFILE ACCORDING TO THE DECONVOLUTION METHOD
- 連續譜X射線(xiàn)在ICT中的能譜硬化修正模型Hardening Correction Model of Energy Spectrum for Continuous Spectrum X-Ray ICT
- 用X射線(xiàn)衍射法測定棉纖維次生胞壁的平均螺旋角The Mean Spiral Angle Measurement of Cotton Fibre Secondary Walls by X-Ray Diffraction
- 摘要介紹色譜法、光譜法、核磁共振波譜、質(zhì)譜及其聯(lián)用技術(shù)、DNA分子診斷技術(shù)、X射線(xiàn)衍射法等幾種現代分析方法在中藥質(zhì)量控制中的應用。Application of modern analytical technology in quality control of traditional chinese medicine (TCM) are introduced in this paper, including chromatographic techniques, spectral techniques, nuclear magnetic resonance (NMR), mass spectrometry (MS, GC-MS, LC-MS, CE-MS, ICP-MS), DNA fingerprint techniques, X-ray diffraction techniques.