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- GB/T17507-1998電子顯微鏡X射線(xiàn)能譜分析生物薄標樣通用技術(shù)條件General specification of thin biological standards for X-Ray EDS microanalysis in electron microscope
- X射線(xiàn)能譜技術(shù)（XPS）XPS
- 軟X射線(xiàn)能譜Soft X-ray spectrum
- INCA-X射線(xiàn)能譜儀INCA X-ray energy dispersive spectrometer
- 用 X射線(xiàn)光電子能譜 （XPS），俄歇電子光譜（AES）和X射線(xiàn)能譜分析（EDAX）等表面分析技術(shù)對摩 擦表面進(jìn)行了分析，結果表明Si3N4陶瓷－金屬摩擦副具有優(yōu)異的摩擦學(xué)特性；The surface analysis techniques of electron spectroscopy for chemical analysis (ESCA), Auger electron spectroscopy (AES) and energy dispersion analysis with X-rays were used to analyze friction surfaces. Test results show that Si3N4 ceramic possesses excellent tribological behavior under the test conditions.
- 用掃描電鏡和X射線(xiàn)能譜儀分析研究了半導體器件鍵合用金絲的斷口。Fracture surfaces of gold wire used for bonding semiconductor devices are researched by Scanning Electron Microscope (SEM) and Energy Dispersive Analysis of X-ray (EDX) .
- X熒光能譜技術(shù)應用于珠寶首飾檢測的原理和方法PRINCIPLES AND METHODS OF EDXRF APPLICATED TO IDENTIFICATION OF GEMS AND JEWELRY
- 噴氣式Z箍縮等離子體輻射軟X射線(xiàn)能譜的研究Study of soft X-ray energy spectra from gas-puff Z-pinch plasma
- Ｘ射線(xiàn)能譜儀X-ray energy spectrometer
- α射線(xiàn)能譜學(xué)α-ray spectrometry
- X射線(xiàn)光電子能譜X-ray photoelectron spectroscopy
- 軟X射線(xiàn)能譜定量測量技術(shù)研究Quantitative Measurement of Soft-X-Ray Spectrum Using Transmission Grating Spectrometer
- 變角X射線(xiàn)光電子能譜ADXPS
- X射線(xiàn)光電子能譜技術(shù)在高分子材料摩擦化學(xué)研究中的應用Application of XPS Technology in Polymer Tribochemical Study
- 連續譜X射線(xiàn)在ICT中的能譜硬化修正模型Hardening Correction Model of Energy Spectrum for Continuous Spectrum X-Ray ICT
- X射線(xiàn)光電子能譜在材料研究中的應用Applications of X-ray Photoelectron Spectroscopy(XPS)in Materials Research
- X射線(xiàn)能譜X ray spectroscopy
- 砷化鎵半導體表面自然氧化層的X射線(xiàn)光電子能譜分析X-Ray Photoelectron Spectrocopic Analysis of Native Oxides Layer on Gallium Arsenide Semiconductor Surface
- HL-1裝置硬X射線(xiàn)能譜及長(cháng)脈沖放電與硬X射線(xiàn)的發(fā)射關(guān)系ENERGY SPECTRUM OF HARD X-RAYS AND CORRELATJON BETWEEN LONG PULSE DISCHARGE AND HARD X-RAY EMISSION IN THE HL-1 TOKAMAK
- 采用X射線(xiàn)光電子能譜（XPS）對InGaAsP/InP異質(zhì)結構MOCVD外延晶片作了表面薄層元素、組分定性、定量和深度分布分析。The X ray Photoelectron Spectroscopy (XPS) has been used for the element qualitation,quantitation,chemical state analysis and depth profile of InGaAsP/InP MOCVD film.
