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- IC測試模式IC test model
- 測試measure and test
- 面向納米IC測試的ATEATE Towards Nano IC Testing
- 自測試模式self-test mode
- IC測試系統精密定時(shí)器的新結構New Architecture of Accurate Clock Generator in IC Test System
- 低毒測試模式lower toxic test mode
- 面向IC測試技術(shù)的精密運動(dòng)平臺的設計Design of the High-Precision Motion Platform for IC Testing
- 自動(dòng)測試模式生成ATPG
- 改變測試模式,有快速Change to Through Test Mode
- IC卡IC-card
- 營(yíng)銷(xiāo)模式marketing model
- 進(jìn)行測試test
- 模式的modal
- 傳輸模式transfer mode
- 測試結果test result
- 分析了ATES測試的生產(chǎn)能力,指出了測試生產(chǎn)中的不足之處,最后闡述了IC測試運作策略。Analysing the capability of IC test in ATES, Points out requiring to solve theproblems based on Bill Transmitter Order(BTO), and then discusses the operation tactics ofIC test.
- 軟件測試software test
- 心理測試psychological test
- 測試報告test report
- 測試方法test method(s)