The characterization of thermoelectric properties of semiconductor nano-films on methods and relative theories are reviewed. 綜述了半導體納米薄膜熱電性能表征的方法及相關(guān)的技術(shù)原理。
Scaning electron microscopy and cyclic voltammetry are applied to characterize both the physical and chemical properties of the Ag ring ultramicroelectrode. 用掃描電子顯微鏡和循環(huán)伏安法對制備的環(huán)電極進(jìn)行了物理和化學(xué)性能表征。
