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- An automatic test pattern generation (ATPG) algorithm for deliberately selected delay faults is presented to cope with the crosstalk-induced delay effects on longer paths. 由于電路中較長(cháng)的通路具有較短的松弛時(shí)間，因此容易因為串擾問(wèn)題產(chǎn)生時(shí)延故障。
- ATPG Automatic Test Pattern Generator 自動(dòng)測試碼生成程序
- automatic test pattern generation (ATPG) 自動(dòng)測試圖形生成
- automatic test pattern generation(ATPG) 自動(dòng)測試生成
- automatic test pattern generation 自動(dòng)測試模式生成
- automatic test pattern generation system 自動(dòng)測試模式產(chǎn)生系統
- An Approach to Automatic Test Pattern Generation Using Chaotic Neural Networks 一種基于混沌神經(jīng)網(wǎng)絡(luò )的自動(dòng)測試生成算法
- Automatic Test Pattern Generation and Functionality Verification Environment 測試向量的自動(dòng)生成及其功能驗證環(huán)境
- automatic test patterns generation(ATPG) 自動(dòng)測試向量生成（ATPG）
- Register assignment algorithm targeting automatic test pattern generation 基于自動(dòng)測試生成的寄存器分配算法
- Ant Path Searching Algorithm for Automatic Test Pattern Generation of Sequential Circuit 基于螞蟻路徑的時(shí)序電路故障診斷算法
- Automatic Test Pattern Generation Based on Particle Swarm Optimization Algorithm for Sequential Circuits 基于粒子群算法的時(shí)序電路測試生成
- VATE? Versatile Automatic Test Equipment? 萬(wàn)用自動(dòng)檢測設備?
- Keywords Integrated Circuits （ICs）;Automatic Test Pattern Generation （ATPG）;Register Transfer Level （RTL）;Testcase; 集成電路;自動(dòng)測試生成;寄存器傳輸級;測試用例;
- US manufacturer of automatic test equipment widely used in ST. 美國自動(dòng)測試設備制造商,其產(chǎn)品在意法半導體廣泛使用。
- The produce of LXI signs a new change in automatic test field. LXI是儀器領(lǐng)域中又一個(gè)新的發(fā)展方向，是下一代新型平臺的主體。
- Able to use automatic testing tools is a plus. 會(huì )用自動(dòng)測試工具者優(yōu)先。
- Able to use automatic testing tools. 會(huì )用自動(dòng)測試工具。
- Keywords Register Transfer Level （RTL）;Finite State Machine （FSM）;Automatic Test Pattern Generation （ATPG）;Delay Testing;Fault Diagnosis; 寄存器傳輸級（RTL）;有限狀態(tài)機;自動(dòng)向量測試產(chǎn)生（ATPG）;時(shí)延測試;故障診斷;
- Figure 3: The simple white-on-black test pattern used to determine some of the effects of aperture shape on the out-of-focus images. 圖三：一些簡(jiǎn)單的黑白的測試圖樣，用于判定光圈形狀對失焦圖像的影響。
