With the wide use of VLSI, the percentage of the open faults, bridging faults and stuck logic faults are rising in the complex PCB, and the testability of PCB is becoming more difficult.

 
  • 摘要隨著(zhù)VLSI電路的廣泛使用,復雜PCB板上的開(kāi)路、橋接和固定邏輯故障的比例逐漸上升,可測試性明顯下降。
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