With the increasing of the scale of integrated circuits (IC), Design-for-Test (DFT) attracts much more attention in IC design industry, and JTAG research is one of the hot issues in DFT.

 
  • 摘要隨著(zhù)集成電路規模的越來(lái)越大,可測性設計越來(lái)越受到業(yè)內的關(guān)注,基于JTAG標準的可測性設計是當前的研究熱點(diǎn)之一;
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