We test the characteristic of the circuits and single transistors after the process experiment, the test results indicate the BCD process is successful and the component circuits and LDMOS operate well.
英
美
- 工藝實(shí)驗后進(jìn)行了正式的芯片流片并完成了功能電路和單管性能的測試,測試結果表明器件和電路參數基本滿(mǎn)足設計指標,說(shuō)明該高壓BCD工藝是成功的,電路與器件也符合設計要求。