To verify the model, a test circuit has been designed to simulate parasitical latch-up paths in CMOS devices and relevant parameters are reported.

 
  • 為了實(shí)驗驗證該模型,設計了實(shí)驗電路以模擬CMOS器件的寄生閉鎖路徑,給出了相應的參數。
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