To reduce the storage volume of the test data during the built-in self-test (BIST), a new BIST technique based on two dimensional compression of test data is presented.

 
  • 摘要為壓縮內建自測試(BIST)期間所需測試數據存儲容量,提出了一種新的基于測試數據兩維壓縮的BIST方案。
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