Tin whiskers, growing spontaneously from Sn and Sn alloy coatings, can cause electrical shorts in the circuit and present a long-term reliability problem to the electronic industry.

 
  • 錫須,一種自發(fā)從錫和錫合金層生長(cháng)出來(lái)的現象,它會(huì )導致電路短路,影響電子產(chǎn)品長(cháng)期的可靠性。
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