Through the analysis, it is shown that the critical periodic point as a function of refractive index is very important to fabricate the antireflective subwavelength grating.

 
  • 同時(shí)證明,臨界周期點(diǎn)隨折射率的變化規律在亞波長(cháng)抗反射光柵的制作中有重要的作用。
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