This paper discusses several difficult problems in DPA of electronic components, and emphasizes the importance of evaluation and analysis to the problems and defects which were found in DPA.
英
美
- 通過(guò)對電子元器件破壞性物理分析（DPA）試驗中遇到的幾個(gè)難點(diǎn)問(wèn)題的分析、討論，強調了在DPA試驗中對發(fā)現的問(wèn)題和缺陷進(jìn)行認真分析和評價(jià)的重要性。
