This article introduced the basic conception of combined digital IC, including classification of digital IC test, controllability, observation, testability, fault, limitation and invalidation etc.

 
  • 摘要介紹了數字集成電路測試的基本概念,包括測試的分類(lèi),以及可控性、可觀(guān)性、可測性、故障、失效和缺陷等概念;
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