The surface chemical properties of both raw semi-coke and activated semi-coke were characterized by acid-base titration, XPS, and FTIR.

 
  • 利用酸堿滴定、工業(yè)分析和元素分析、X-射線(xiàn)光電子能譜(XPS)、傅立葉轉換紅外光譜(FTIR)等表征原料半焦和活性半焦表面化學(xué)性質(zhì)。
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