The structure and surface state of nano particles were characterized by physical techniques, including TEM, IR, XPS and EDX measurement.

 
  • 用透射電鏡 (TEM)、紅外光譜 (IR)、X射線(xiàn)光電子能譜 (XPS)和X射線(xiàn)分散能譜儀 (EDX)等對石決明進(jìn)行了表征。
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