The structural evolution of the pyrolytic products of PI film during the carbonization have been measured by using X ray diffraction technique.

 
  • 用X射線(xiàn)衍射技術(shù)測定了PI(聚酰亞胺)薄膜在炭化過(guò)程中熱裂解固態(tài)產(chǎn)物結構的演變。
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