The pattern, structure and electrical property based on SCLC method of the films are discussed to seek for the relations of the film structure and the electrical property.

 
  • 為了尋找薄膜結構和電學(xué)性質(zhì)的關(guān)系,對薄膜的形貌、結構和基于SCLC方法的電學(xué)特性進(jìn)行了探討。
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