The part-BS PCB boards composed of BS chips and non-BS chips will exist widely for a long time, how to test these boards using boundary scan technique remains a key problem.

 
  • 摘要由BS器件和非BS器件組裝的非完全BS電路板仍在今后相當時(shí)間廣泛存在,如何對它們應用邊界掃描測試是板級邊界掃描測試技術(shù)需要研究的關(guān)鍵問(wèn)題。
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