The oxide films were investigated by means of scanning electron microcopy(SEM),energy dispersion X-ray microanalyser(EDX),X-ray diffraction(XRD) and X-ray photoelectron spectroscopy(XPS).

 
  • 用掃描電鏡、能譜儀、X射線(xiàn)衍射、X射線(xiàn)光電子能譜對氧化膜進(jìn)行了研究。
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