The optimized RC parameters of the circuit are derived from current decay process during P-N junction reverse recovery simulated with the exponential function and from scanning function of PSPICE.

 
  • 該方法利用指數函數模擬P-N結反向恢復時(shí)的電流衰減過(guò)程,并用PSPICE的參數掃描功能獲得吸收電路RC的最佳參數值。
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