The new algorithm is applied to find the target location of cell during the placement optimization, and it is combined with a heuristic local optimization approach to experiment on MCNC (Microelectronics Centre of North-Carolina) standard cell benchmarks.
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- 針對集成電路標準單元模式的布局問(wèn)題；提出了一個(gè)全新的基于改進(jìn)等分節點(diǎn)法的啟發(fā)式標準單元布局算法(TETP).；該算法在優(yōu)化布局過(guò)程中采用改進(jìn)的等分節點(diǎn)法尋找單元目標位置；同時(shí)結合局部尋優(yōu)的啟發(fā)式算法；對MCNC(MicroelectronicsCentreofNorth-Carolina)標準單元測試電路進(jìn)行實(shí)驗
