The failure of charge coupled devices (CCD ) irradiated by 800nm fs laser with pulse duration of 60 fs was studied.

　
英 美
  • 用脈寬為60fs、波長(cháng)為800nm的fs激光輻照電荷耦合器件,研究了電荷耦合器件在fs激光作用下的失效問(wèn)題。
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