The application of SIEMENS PLC in thickness gauge of thin films is studied, and the merits and demerits of electric control systems based on industrial computer and PLC are compared.

 
  • 摘要對西門(mén)子PLC(可編程控制器)在薄膜測厚儀上的應用進(jìn)行了研究,并比較了傳統的以工控機為核心的電控系統與以PLC為電控核心的系統的優(yōu)缺點(diǎn)。
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