The XPS analysis indicates that the stoichiometric excess of CSN in both solutions shows that the CuSCN thin film deposited on ITO glass is ptype semiconductor.

 
  • 通過(guò)XPS分析表明:2種溶劑中制備的CuSCN薄膜均為SCN化學(xué)劑量比過(guò)量,具有p型半導體特征。
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