Some of these are a bit dry and technical: research indicates static analysis defect density and function length are statistically uncorrelated, for example.

 
  • 有些結論可能有點(diǎn)枯燥并且技術(shù)性比較強:研究發(fā)現靜態(tài)分析漏洞的密度和函數的長(cháng)度在統計上是無(wú)關(guān)的。
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