Silver(Ag) layers and zirconia(ZrO_2) films deposited on K9 glasses are measured by this instrument,then using the scalar scattering method,the root mean square(RMS) roughness of these films are calculated.

 
  • 利用該儀器對K9基底上的銀(Ag)膜和氧化鋯(ZrO2)薄膜進(jìn)行了測量,并根據標量散射理論得到了表面均方根(RMS)粗糙度。
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