Scanning electron microscope and energy dispersive spectrum (EDS) was used to measure the thickness of the reaction layer and to determine the Zr,Fe and Cr concentration penetrate profile of reaction layer, respectively.
英
美
- 用掃描電鏡觀(guān)測反應層寬度,用能譜儀(EDS)測定了反應層Zr、Fe和Cr沿擴散方向的濃度分布,研究了反應層的生長(cháng)動(dòng)力學(xué)。
