On the basis of measuring the wettability of TiN, TiC films by Ag, Cu,Ni and Fe, their interfaces have been investigated with a Scanning Electron Microscope (SEM) and an Electron Probe Micro-Analyzer (EPMA).
英
美
- 本文在對 TiN、TiC陶瓷薄膜與金屬 Ag、 Cu、 Ni、 Fe間的浸潤性測量的基礎上，用掃描電子顯微鏡（SEM）、電子探針（EPMA）對其界面進(jìn)行了觀(guān)察。
