In this scheme, a TPG is designed by a low cost structural modification of an accumulator with an algorithm for single input change test sequence generation.

 
  • 該方案通過(guò)對累加器結構作低成本的設計改進(jìn),并通過(guò)一種高效的單跳變序列生成算法設計了時(shí)延故障測試序列生成器。
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