In the research of light quantity to the crystal material and in the survey to the crystal retards component, the measuring accuracy is influenced heavily because of the photo source fluctuation.

 
  • 摘要在對晶體材料的光學(xué)性質(zhì)的研究和對晶體器件延遲量的測量中,常因光源起伏影響測量精度,出現較大的測量誤差。
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