In n-MOSFET, we found the worst case stress condition occurred under Vg=peak Isub at operating voltage, and interface traps are primary damage in n-MOSFET.是什么意思_In n-MOSFET, we found the worst case stress condition occurred under Vg=peak Isub at operating voltage, and interface traps are primary damage in n-MOSFET.在線(xiàn)翻譯_英語(yǔ)_讀音_用法_例句