Electronic properties of several Hg1-xMnxTe wafers before and after chemical polish were characterized by Van Der Pauw method at 77 K.

 
  • 采用范德堡法在77K下對多個(gè)Hg1-xMnxTe晶片化學(xué)拋光前后的電學(xué)性能進(jìn)行了Hall測量。
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