By using Differential Interference Contrast (DIC) microscopy,the particle size distribution of the coarse and fine particle was observed,similar to that of Andersen Model 240 dual channel mass sampler.
英
美
- 利用具有無(wú)限遠光學(xué)系統的微分干涉相襯顯微技術(shù)對該系統所采集到的顆粒物進(jìn)行了顯微觀(guān)察,得到粗顆粒和細顆粒的粒徑分布,與Andersen公司240型雙通道采樣器的切割性能十分接近。
