Because the distribution of molecular director was not affected by lamellar decorating after quench, chemical etching and SEM technique were used to reveal disclination and director patterns.

 
  • 由于樣品淬火后晶片裝飾在織構上而不影響分子取向矢的分布,因而可以用化學(xué)刻蝕和電鏡技術(shù)揭示其向錯和取向矢圖。
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