According to experimental results, the mechanism of leakage current instability is given as due to an increase in Z+n density at the grain surface. Consequently, the Schottky barrier at the ZnO grain surface is decreased and the leakage current increased.

 
  • 根據實(shí)驗結果;提出漏電流不穩定性的機理是鋅離子在晶粒表面積累;降低了氧化鋅表面肖特基勢壘的高度;使漏電流上升.
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